Testing of Digital Systems pdf epub mobi txt 电子书下载 2024

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Jha, Niraj K./ Gupta, Sandeep

Cambridge Univ Pr

2003-5

1016

$ 195.49

HRD

9780521773560

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发表于2024-09-20

Testing of Digital Systems epub 下载 mobi 下载 pdf 下载 txt 电子书下载 2024

Testing of Digital Systems pdf epub mobi txt 电子书下载 2024

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Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.

Testing of Digital Systems 下载 mobi epub pdf txt 电子书