Test Driven Development for Embedded C pdf epub mobi txt 电子书 下载 2024


Test Driven Development for Embedded C

简体网页||繁体网页
James W. Grenning
Pragmatic Bookshelf
2011-5-2
310
USD 34.95
Paperback
9781934356623

图书标签: TDD  C  嵌入式  程序设计  测试驱动开发  Programming  编程  敏捷开发   


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发表于2024-11-23

Test Driven Development for Embedded C epub 下载 mobi 下载 pdf 下载 txt 电子书 下载 2024

Test Driven Development for Embedded C epub 下载 mobi 下载 pdf 下载 txt 电子书 下载 2024

Test Driven Development for Embedded C pdf epub mobi txt 电子书 下载 2024



图书描述

Did you write C code last week? Does your code work? Is your design clean? If you answered yes to the first question but got queasy over the second two, you need to know about Test Driven Development. TDD helps you write code that works the first time, and then helps you keep it running as the code evolves to meet new needs.

In Test Driven Development for Embedded C, author James W. Grenning shows embedded software developers how to bring the benefits of TDD to embedded C.

In the book, you'll see how to apply TDD to C and the world of embedded software development. Learn how to break key dependencies, allowing code to be tested thoroughly. Explore how to test-drive your product's core logic, exploiting the power of your development environment to deliver better software.

In fact, as the book shows, you can test-drive a device driver before you even have the device soldered into a circuit board. Avoid the natural delays when testing on the target by using the tailored TDD Microcycle, employing off-target tests and dual-targeted code.

Learn how to make code testable and more flexible, better able to handle the inevitable changes demanded by the market. The tests drive development and then serve as an executable specification, keeping track of the critical details and assumptions baked into the code.

In Test Driven Development for Embedded C, you'll find that TDD is a different way to program-unit tests are written in a tight feedback loop with the production code, producing testable code and greatly reducing wasteful debugging. TDD also influences design. When tests are considered part of design, you create modular and loosely coupled code, the hallmarks of a good design.

With Test Driven Development for Embedded C, C developers-even embedded C developers-can finally write cleaner, testable code with TDD.

Test Driven Development for Embedded C 下载 mobi epub pdf txt 电子书

著者简介

James Grenning trains, coaches, and consults worldwide. His considerable experience brings depth in both technical and business aspects of software development. James is leading the way to introduce Agile development practices to the embedded world. He invented Planning Poker and is one of the original authors of the Manifesto for Agile Software Development, February 2001.


图书目录


Test Driven Development for Embedded C pdf epub mobi txt 电子书 下载
想要找书就要到 小哈图书下载中心
立刻按 ctrl+D收藏本页
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用户评价

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蛮不错。PART4似乎变成作者的读书笔记了...

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蛮不错。PART4似乎变成作者的读书笔记了...

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"圣经" - 可以用来给写嵌入式的传敏捷教用

评分

非常棒的一般关于嵌入式C语言开发者如何利用TDD来提高代码质量的一般书,推荐每一个从事嵌入式编程的开发者仔细阅读。

评分

非常棒的一般关于嵌入式C语言开发者如何利用TDD来提高代码质量的一般书,推荐每一个从事嵌入式编程的开发者仔细阅读。

读后感

评分

部分1 第一章 基本思想,增量式开发,先根据接口写测试代码(结对测试?一个人写测试代码,或者都是自己写),自动化执行(使得可复用), 并遵循“微循环”的模式 第二章 工具介绍 run_test_case = test_setup+test+test_teardown <运行make -i -f MakefileUnity.mk...

评分

部分1 第一章 基本思想,增量式开发,先根据接口写测试代码(结对测试?一个人写测试代码,或者都是自己写),自动化执行(使得可复用), 并遵循“微循环”的模式 第二章 工具介绍 run_test_case = test_setup+test+test_teardown <运行make -i -f MakefileUnity.mk...

评分

部分1 第一章 基本思想,增量式开发,先根据接口写测试代码(结对测试?一个人写测试代码,或者都是自己写),自动化执行(使得可复用), 并遵循“微循环”的模式 第二章 工具介绍 run_test_case = test_setup+test+test_teardown <运行make -i -f MakefileUnity.mk...

评分

部分1 第一章 基本思想,增量式开发,先根据接口写测试代码(结对测试?一个人写测试代码,或者都是自己写),自动化执行(使得可复用), 并遵循“微循环”的模式 第二章 工具介绍 run_test_case = test_setup+test+test_teardown <运行make -i -f MakefileUnity.mk...

评分

部分1 第一章 基本思想,增量式开发,先根据接口写测试代码(结对测试?一个人写测试代码,或者都是自己写),自动化执行(使得可复用), 并遵循“微循环”的模式 第二章 工具介绍 run_test_case = test_setup+test+test_teardown <运行make -i -f MakefileUnity.mk...

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