Stress-induced Phenomena in Metallization pdf epub mobi txt 电子书 下载 2025
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Ogawa, Shinichi (EDT)/ Ho, Paul S. (EDT)/ Zschech, Ehrenfried (EDT)
2007-11
212
$ 111.87
9780735404595
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发表于2025-03-17
Stress-induced Phenomena in Metallization epub 下载 mobi 下载 pdf 下载 txt 电子书 下载 2025
Stress-induced Phenomena in Metallization epub 下载 mobi 下载 pdf 下载 txt 电子书 下载 2025
Stress-induced Phenomena in Metallization pdf epub mobi txt 电子书 下载 2025
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The conference was on reliability related science in ULSI interconnect. Its main purpose was to discuss the stress induced phenomena in the LSI interconnect among academic researchers and industry engineers to establish academic science and to improve the reliability of ULSI chips. All papers were peer reviewed.
Stress-induced Phenomena in Metallization 下载 mobi epub pdf txt 电子书
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Stress-induced Phenomena in Metallization pdf epub mobi txt 电子书 下载 2025