Characterization and Metrology for ULSI Technology 2005 pdf epub mobi txt 电子书下载 2024

☆☆☆☆☆
简体网页||繁体网页

Seiler, D. G.; Seiler, David G.; Diebold, Alain C.

American Inst. of Physics

2005-9-29

667

USD 245.00

Hardcover

9780735402775

图书标签:

喜欢 Characterization and Metrology for ULSI Technology 2005 的读者还喜欢

下载链接在页面底部

点击这里下载

facebook linkedin mastodon messenger pinterest reddit telegram twitter viber vkontakte whatsapp 复制链接

想要找书就要到小哈图书下载中心

qciss.net

立刻按 ctrl+D收藏本页

你会得到大惊喜!!

发表于2024-11-23

Characterization and Metrology for ULSI Technology 2005 epub 下载 mobi 下载 pdf 下载 txt 电子书下载 2024

Characterization and Metrology for ULSI Technology 2005 pdf epub mobi txt 电子书下载 2024

图书描述

The worldwide semiconductor community faces increasingly difficult challenges in the era of silicon nanotechnology and beyond. The magnitude of these challenges demands special attention from the metrology and analytical measurements community. New paradigms must be found. Adequate research and development for new metrology concepts are urgently needed. Characterization and metrology are key enablers for developing new semiconductor technology and in improving manufacturing. This book summarizes major issues and gives critical reviews of important measurement techniques that are crucial to continuing the advances in semiconductor technology. It covers major aspects of process technology and most characterization techniques for silicon research, including development, manufacturing, and diagnostics. The book also covers emerging nano-devices and the corresponding metrology challenges that arise.

Characterization and Metrology for ULSI Technology 2005 下载 mobi epub pdf txt 电子书