VLSI Test Principles and Architectures pdf epub mobi txt 电子书下载 2024

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Wang, Laung-terng (EDT)/ Wu, Cheng-Wen (EDT)/ Wen, Xiaoqing (EDT)

Elsevier Science Ltd

2006-7

808

620.00元

HRD

9780123705976

图书标签: VLSI 可测性设计计算机体系结构计算机英文微电子体系结构 EE

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发表于2024-05-20

VLSI Test Principles and Architectures epub 下载 mobi 下载 pdf 下载 txt 电子书下载 2024

VLSI Test Principles and Architectures pdf epub mobi txt 电子书下载 2024

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This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

· Most up-to-date coverage of design for testability. · Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. · Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures. · Lecture slides and exercise solutions for all chapters are now available. · Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.

VLSI Test Principles and Architectures 下载 mobi epub pdf txt 电子书