Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices pdf epub mobi txt 电子书下载 2024

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Schrimpf, R. D. 编

World Scientific Publishing Co Pte Ltd

2004-8

348

$ 172.89

HRD

9789812389404

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发表于2024-11-24

Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices epub 下载 mobi 下载 pdf 下载 txt 电子书下载 2024

Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices pdf epub mobi txt 电子书下载 2024

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This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide- semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.

Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices 下载 mobi epub pdf txt 电子书